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Prayers of the people: Moral metaphors in the right-to-life and faith-based labor movements

Rebekah Peeples Massengill

Journal:

Poetics

Année:

2008

Langue:

english

Fichier:

PDF, 190 KB

english, 2008

Glaucoma detection and evaluation through pattern recognition in standard automated perimetry data

Dariusz Wroblewski, Brian A. Francis, Vikas Chopra, A. Shahem Kawji, Peter Quiros, Laurie Dustin, R. Kemp Massengill

Journal:

Graefe's Archive for Clinical and Experimental Ophthalmology

Année:

2009

Langue:

english

Fichier:

PDF, 517 KB

english, 2009

A quantitative study on the relationship between grasp and handwriting legibility: does grasp really matter?

Donica, Denise K., Massengill, Meghan, Gooden, Mary Jessup

Journal:

Journal of Occupational Therapy Schools & Early Intervention

Année:

2018

Langue:

english

Fichier:

PDF, 2.04 MB

english, 2018

Basic mechanisms and modeling of single-event upset in digital microelectronics

Dodd, P.E., Massengill, L.W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2003

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2003

Making sense of teaching through metaphors: a review across three studies

Mahlios, M., Massengill-Shaw, D., Barry, A.

Journal:

Teachers and Teaching: Theory and Practice

Année:

2010

Langue:

english

Fichier:

PDF, 127 KB

english, 2010

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Neutron and alpha particle-induced transients in 90 nm technology

Narasimham, Balaji, Gadlage, Matthew J., Bhuva, Bharat L., Schrimpf, Ronald D., Massengill, Lloyd W., Holman, W. Timothy, Witulski, Arthur F., Xiaowei Zhu,, Balasubramanian, Anupama, Wender, Steve A.

Année:

2008

Langue:

english

Fichier:

PDF, 273 KB

english, 2008

Single-Event Transient Measurements in nMOS and pMOS Transistors in a 65-nm Bulk CMOS Technology at Elevated Temperatures

Gadlage, Matthew J., Ahlbin, Jonathan R., Narasimham, Balaji, Bhuva, Bharat L., Massengill, Lloyd W., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 991 KB

english, 2011

Promise and Possibility ‐ Hope for Teacher Education: Pre‐service Literacy Instruction Can Have an Impact

Shaw, Donita Massengill, Dvorak, Marcia J., Bates, Karen

Journal:

Reading Research and Instruction

Année:

2007

Langue:

english

Fichier:

PDF, 1.90 MB

english, 2007

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Single event transient pulse width measurements in a 65-nm bulk CMOS technology at elevated temperatures

Gadlage, M. J., Ahlbin, J. R., Bhuva, B. L., Massengill, L. W., Schrimpf, R. D.

Année:

2010

Langue:

english

Fichier:

PDF, 799 KB

english, 2010

Medication Treatment Complexity and Adherence in Children with CKD

Blydt-Hansen, T. D., Pierce, C. B., Cai, Y., Samsonov, D., Massengill, S., Moxey-Mims, M., Warady, B. A., Furth, S. L.

Journal:

Clinical Journal of the American Society of Nephrology

Année:

2014

Langue:

english

Fichier:

PDF, 706 KB

english, 2014

[American Society of Civil Engineers Ports Conference 2001 - Norfolk, Virginia, United States (April 29-May 2, 2001)] Ports '01 - Evaluation of the Corpus Christi Seawall

Massengill, Jeff B.

Année:

2001

Langue:

english

Fichier:

PDF, 227 KB

english, 2001

Ionizing Radiation Effects Spectroscopy (IRES) for Analysis of Total-Ionizing Dose Degradation in RF Circuits

Patel, B., Joplin, M., Boggs, R. C., Reising, D. R., McCurdy, M. W., Massengill, L. W., Loveless, T. D.

Journal:

IEEE Transactions on Nuclear Science

Année:

2018

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2018

The sensitivity of radiation-induced leakage to STI topology and sidewall doping

Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2011

Acetabular labrum and capsule (limbus) blocking reduction of a left hip dislocation

Boonyaporn Vasuratna, Alan D. Massengill, Jeffery J. Tucker

Journal:

Emergency Radiology

Année:

1998

Langue:

english

Fichier:

PDF, 569 KB

english, 1998

The Effect of Two Handwriting Approaches, D’Nealian and Sunform, on Kindergartners’ Letter Formations

Donita Massengill Shaw

Journal:

Early Childhood Education Journal

Année:

2011

Langue:

english

Fichier:

PDF, 201 KB

english, 2011

Educational Attainment and Cohort Change Among Conservative Protestants, 1972–2004

REBEKAH PEEPLES MASSENGILL

Journal:

Journal for the Scientific Study of Religion

Année:

2008

Langue:

english

Fichier:

PDF, 130 KB

english, 2008

Do Parents Benefit? Perspectives of Low-Income Parents Who Received a Free Early Readiness Program for Their Child

Donita Massengill

Journal:

Early Childhood Education Journal

Année:

2004

Langue:

english

Fichier:

PDF, 62 KB

english, 2004

Monte Carlo Simulation of Single Event Effects

Weller, Robert A., Mendenhall, Marcus H., Reed, Robert A., Schrimpf, Ronald D., Warren, Kevin M., Sierawski, Brian D., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 851 KB

english, 2010

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Soft-Error Charge-Sharing Mechanisms at Sub-100nm Technology Nodes

Massengill, L. W., Amusan, O. A., Dasgupta, S., Sternberg, A. L., Black, J. D., Witulski, A. F., Bhuva, B. L., Alles, M.L.

Année:

2007

Langue:

english

Fichier:

PDF, 2.24 MB

english, 2007

The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process

Ahlbin, J. R., Gadlage, M. J., Ball, D. R., Witulski, A. W., Bhuva, B. L., Reed, R. A., Vizkelethy, G., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 657 KB

english, 2010

Sex-role stereotypes and requisite management characteristics: A current replication

Douglas Massengill, Nicholas Marco

Journal:

Sex Roles

Année:

1979

Langue:

english

Fichier:

PDF, 489 KB

english, 1979

Admissible probability measurement procedures

Emir H. Shuford, Arthur Albert, H. Edward Massengill

Journal:

Psychometrika

Année:

1966

Langue:

english

Fichier:

PDF, 990 KB

english, 1966

Investigation of the potential utility of a linomide analogue for treatment of choroidal neovascularization

M.H. Abdel-Rahman, Y. Yang, M.M. Salem, S. Meadows, James B. Massengill, P.-K. Li, F.H. Davidorf

Journal:

Experimental Eye Research

Année:

2010

Langue:

english

Fichier:

PDF, 790 KB

english, 2010

Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths

Ahlbin, J.R., Gadlage, M.J., Atkinson, N.M., Narasimham, B., Bhuva, B.L., Witulski, A.F., Holman, W.T., Eaton, P.H., Massengill, L.W.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 697 KB

english, 2011

Single-Event-Hardened CMOS Operational Amplifier Design

Blaine, Raymond W., Atkinson, Nick M., Kauppila, Jeffrey S., Loveless, T. Daniel, Armstrong, Sarah E., Holman, W. Tim, Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2012

Langue:

english

Fichier:

PDF, 1.44 MB

english, 2012

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Narasimham, Balaji, Bhuva, Bharat L., Schrimpf, Ronald D., Massengill, Lloyd W., Gadlage, Matthew J., Amusan, Oluwole A., Holman, William Timothy, Witulski, Arthur F., Robinson, William H., Black, Jef

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 938 KB

english, 2007

Increased Single-Event Transient Pulsewidths in a 90-nm Bulk CMOS Technology Operating at Elevated Temperatures

Gadlage, M.J., Ahlbin, J.R., Narasimham, B., Ramachandran, V., Dinkins, C.A., Pate, N.D., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Shuler, R.L., McMorrow, D.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 834 KB

english, 2010

Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Amusan, O.A., Massengill, L.W., Baze, M.P., Sternberg, A.L., Witulski, A.F., Bhuva, B.L., Black, J.D.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 994 KB

english, 2008

Development of new methods for phalangeal fracture fixation

Harold Alexander, Noshir Langrana, James B. Massengill, Andrew B. Weiss

Journal:

Journal of Biomechanics

Année:

1981

Langue:

english

Fichier:

PDF, 1.94 MB

english, 1981

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., Black, J.D., Balasubramanian, A., Casey, M.C., Black, D.A., Ahlbin, J.R., Reed, R.A., McCurdy, M.W.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 901 KB

english, 2009

Investigation of millisecond-long analog single-event transients in the LM6144 op amp

Boulghassoul, Y., Buchner, S., McMorrow, D., Pouget, V., Massengill, L.W., Fouillat, P., Holman, W.T., Poivey, C., Howard, J.W., Savage, M., Maher, M.C.

Journal:

IEEE Transactions on Nuclear Science

Année:

2004

Langue:

english

Fichier:

PDF, 875 KB

english, 2004

Single Event Transients in Digital CMOS—A Review

Ferlet-Cavrois, V., Massengill, L. W., Gouker, P.

Journal:

IEEE Transactions on Nuclear Science

Année:

2013

Langue:

english

Fichier:

PDF, 2.76 MB

english, 2013

Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor

Massengill, L.W., Baranski, A.E., Van Nort, D.O., Meng, J., Bhuva, B.L.

Journal:

IEEE Transactions on Nuclear Science

Année:

2000

Langue:

english

Fichier:

PDF, 109 KB

english, 2000

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Technology scaling and soft error reliability

Massengill, Lloyd W., Bhuva, Bharat L., Holman, W. Timothy, Alles, Michael L., Loveless, T. Daniel

Année:

2012

Langue:

english

Fichier:

PDF, 2.69 MB

english, 2012

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Olson, Brian D., Amusan, Oluwole A., Dasgupta, Sandeepan, Massengill, Lloyd W., Witulski, Arthur. F., Bhuva, Bharat L., Alles, Michael L., Warren, Kevin M., Ball, Dennis R.

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 245 KB

english, 2007

Quantifying the Reduction in Collected Charge and Soft Errors in the Presence of Guard Rings

Narasimham, B., Shuler, R.L., Black, J.D., Bhuva, B.L., Schrimpf, R.D., Witulski, A.F., Holman, W.T., Massengill, L.W.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 611 KB

english, 2008

HBD layout isolation techniques for multiple node charge collection mitigation

Black, J.D., Sternberg, A.L., Alles, M.L., Witulski, A.F., Bhuva, B.L., Massengill, L.W., Benedetto, J.M., Baze, M.P., Wert, J.L., Hubert, M.G.

Journal:

IEEE Transactions on Nuclear Science

Année:

2005

Langue:

english

Fichier:

PDF, 515 KB

english, 2005

Demonstration of a Differential Layout Solution for Improved ASET Tolerance in CMOS A/MS Circuits

Armstrong, S. E., Olson, B. D., Holman, W. T., Warner, J., McMorrow, D., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 673 KB

english, 2010

The Texture of Hardship: Qualitative Sociology of Poverty, 1995–2005

Newman, Katherine S., Massengill, Rebekah Peeples

Journal:

Annual Review of Sociology

Année:

2006

Langue:

english

Fichier:

PDF, 247 KB

english, 2006

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - The Effects of Scaling and Well and Substrate Contact Placement on Single Event Latchup in Bulk CMOS Technology

Hutson, John M., Schrimpf, R. D., Massengill, L. M.

Année:

2005

Langue:

english

Fichier:

PDF, 1.93 MB

english, 2005

Chronic Kidney Disease in Children and Adolescents

Massengill, S. F., Ferris, M.

Journal:

Pediatrics in Review

Année:

2014

Langue:

english

Fichier:

PDF, 664 KB

english, 2014

Sociological Writing as Higher-level Thinking: Assignments That Cultivate the Sociological Imagination

Rebekah Peeples Massengill

Journal:

Teaching Sociology

Année:

2011

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2011

Biographical Directory of the South Carolina Senate, 1776-1985. Volume I: Volume II: Volume IIIby N. Louise Bailey; Mary L. Morgan; Carolyn R. Taylor

Review by: Stephen E. Massengill

Journal:

The North Carolina Historical Review

Année:

1987

Langue:

english

Fichier:

PDF, 298 KB

english, 1987

Literacy metaphors of pre-service teachers: do they change after instruction? Which metaphors are stable? How do they connect to theories?

Shaw, Donita Massengill, Mahlios, Marc

Journal:

Journal of Education for Teaching / International Research and Pedagogy

Année:

2011

Langue:

english

Fichier:

PDF, 107 KB

english, 2011

Weight decay and resolution effects in feedforward artificial neural networks

Mundie, D.B., Massengill, L.W.

Journal:

IEEE Transactions on Neural Networks

Année:

1991

Langue:

english

Fichier:

PDF, 369 KB

english, 1991

On-Chip Characterization of Single-Event Transient Pulsewidths

B. Narasimham, V. Ramachandran, B. L. Bhuva, R. D. Schrimpf, A. F. Witulski, W. T. Holman, L. W. Massengill, J. D. Black, W. H. Robinson, D. Mcmorrow

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 435 KB

english, 2006

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Soft Error Considerations for Multicore Microprocessor Design

Robinson, William H., Alles, Michael L., Bapty, Theodore A., Bhuva, Bharat L., Black, Jeffrey D., Bonds, Alfred B., Massengill, Lloyd W., Neema, Sandeep K., Schrimpf, Ronald D., Scott, Jason M.

Année:

2007

Langue:

english

Fichier:

PDF, 1.62 MB

english, 2007

Management of Childhood Onset Nephrotic Syndrome

Gipson, D. S., Massengill, S. F., Yao, L., Nagaraj, S., Smoyer, W. E., Mahan, J. D., Wigfall, D., Miles, P., Powell, L., Lin, J.-J., Trachtman, H., Greenbaum, L. A.

Journal:

PEDIATRICS

Année:

2009

Langue:

english

Fichier:

PDF, 342 KB

english, 2009

Promoting Professional Student Learning Through Study Groups: A Case Study

Shaw, Donita Massengill

Journal:

College Teaching

Année:

2011

Langue:

english

Fichier:

PDF, 152 KB

english, 2011

Implications of Dopant-Fluctuation-Induced $V_{\rm t}$ Variations on the Radiation Hardness of Deep Submicrometer CMOS SRAMs

Balasubramanian, A., Fleming, P.R., Bhuva, B.L., Sternberg, A.L., Massengill, L.W.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2008